Characterization Optical component characterization
Miscellaneous optical component testing
Other tools for testing optical and photonic components (in addition to other service cards)
Characterization Light sources
Nanosecond systems
Nanosecond laser systems can provide tens-of-mJ pulse energies and are often used for sample excitation, nonlinear phenomena study, material processing and LIBS measurements, often combined with frequency converters such as OPO or harmonic generators.
Characterization Material and thin film characterization
Nextron Micro Probe test chamber
Test chamber enables electric measurements of a sample under controlled environment and illumination.
Characterization Light source characterization , Optical component characterization
Optical near-field characterization
Measurement of optical near fields from the surfaces of optical components
Characterization Surface and shape analysis
Optical surface profilometry
Optical profilometers enable contactless measurement of surfaces.
Characterization Spectral analysis and imaging
Polarized optical microscope (POM)
Zeiss Axio Imager Pol polarized light microscope. Fitted with a regular rotating stage and a Linkam cooling/heating stage.
Characterization Optical component characterization