Characterization Optical component characterization
Solar cell characterization
Test services and tools for solar cell components and modules
Characterization Optical component characterization
Solar cell characterization
Solar cell characterization services
Characterization Electron spectroscopy for surface analysis
Spectromicroscopy
The Scienta Omicron NanoESCA surface analysis instrument is a modular ultrahigh vacuum system combining spectromicroscope and in-situ sample preparation techniques. The spectromicroscope is an energy-filtering photoemission electron microscope (PEEM) with techniques: PES, XPS, UPS, PEEM, EF-PEEM, and momentum microscopy. The…
Characterization Test automation and data analysis
Spectroscopic data analysis and data libraries
Software tools to analyse spectral data, including libraries of spectroscopic data.
Characterization Material and thin film characterization
Spectroscopic materials characterization
Spectrophotometer, range 180-3000 nm, including integrating sphere and specular reflection additions for non-transparent samples.
Characterization Spectral analysis and imaging
Stereo microscope
ZEISS SteREO Discovery.V12, 100x zoom, for 3D microscopy imaging.
Characterization Electron spectroscopy for surface analysis