Characterization

We offer a wide range of characterization methods for materials, light sources, optical components, surface analysis, high-speed testing, and spectral analysis.

Characterization Electron spectroscopy for surface analysis

X-ray photoelectron spectroscopy (XPS)

The Scienta Omicron Argus Electron Spectrometer includes instruments for Selected-area and Imaging X-ray Photoelectron Spectroscopy (SAXPS/iXPS). The UHV system is modular including also preparation chambers equipped with in-situ sample preparation and fabrication facilities.

More info

Characterization Spectral analysis and imaging

X-Ray sensors

More info

X-ray photoelectron spectroscopy (XPS)

X-Ray sensors

FinnLight

Sitemap

Contact information