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Characterization Material and thin film characterization

Nextron Micro Probe test chamber

Nextron MPS-PTC6 test chamber

Test chamber enables electric measurements of a sample under controlled environment and illumination.


Location: University of Eastern Finland (UEF), Joensuu
Contact person: Pertti Pääkkönen (Joensuu)
Wavelength: UV (150 nm - 400 nm), VIS (400 nm - 700 nm), NIR (700 nm - 1200 nm), SWIR (1.2 µm - 2.5 µm)

Nextron MPS-PT6C 6 channel Micro Probe System test chamber with 125 cm3 vacuum or controlled atmosphere, temperature control and sapphire window. Six manually adjustable probes enable electric measurements of the sample from DC to 10 MHz range.

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