Characterization Surface and shape analysis
Diffractometry and scatterometry
Charaterization of surfaces based on the diffraction or scattering of light from the surface.
Characterization Surface and shape analysis
Digital holographic microscopy and interference lithography
Digital holographic microscopy (DHM) is a quantitative phase imaging technique, where both the amplitude and phase of light interacting with a sample are measured. The phase contains information on the height and refractive index variations on a sample. In the…
Characterization Material and thin film characterization
Electron spectroscopy
The Multilab/Argus Electron Spectrometer includes instruments for Selected-area and Imaging X-ray Photoelectron Spectroscopy (SAXPS/iXPS). The UHV system is modular including also preparation chambers equipped with various in situ sample preparation and fabrication facilities.
Characterization Light sources
Femtosecond systems
Femtosecond lasers create trains of sub pico-second pulses, at various repetition rates and pulse energies. They usually have good mode quality and high temporal stability.
Characterization Light sources
Fiber lasers
Fiber lasers usually offer small size and user-friendly operation, especially when used in fiber-based experiments. They can be designed to operate in all pulse duration regimes.
Characterization Light source characterization
Frequency and linewidth characterization
Understanding the laser beam properties is essential for many applications.
Characterization Material and thin film characterization
