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Characterization Light source characterization

Frequency and linewidth characterization

Frequency comb

Understanding the laser beam properties is essential for many applications.


Location: VTT, Tampere University (TAU), Espoo, Tampere
Contact persons: Jeremias Seppä (Espoo), Mikko Närhi (Tampere)
Wavelength: VIS (400 nm - 700 nm), SWIR (1.2 µm - 2.5 µm), NIR (700 nm - 1200 nm)

Characterization of laser light source linewidths and frequencies with high accuracy is essential for some applications.

Our traceable instruments for such needs are:

  • Frequency comb, Menlo Systems, rep rate (100 MHz) and offset locked to H-maser, outputs available between 500 nm – 1600 nm (approximately), absolute frequency and line width characterization,  (contact Jeremias Seppä)
  • Wavemeters High Finesse WS7-30: 330-1180 nm,  10 MHz – 30 MHz abs. accuracy; Hewlett-Packard 86120B,  700 – 1650 nm, ±3 ppm abs. accuracy, 1 Ghz resolution, frequency (and mode structure) characterization  (contact Jeremias Seppä)
  • Iodine stabilised lasers at 633 nm, 543,5 nm  (contact Jeremias Seppä)
  • EXFO Wavemeter, WA-1500, +/- 0.2 ppm (0.0002 nm at 1000 nm), Operating ranges are 400-1100 nm and 600-1800 nm with replaceable photodetectors (contact Mikko Närhi)

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