Characterization
We offer a wide range of characterization methods for materials, light sources, optical components, surface analysis, high-speed testing, and spectral analysis.
Characterization Surface and shape analysis
Diffractometry and scatterometry
Charaterization of surfaces based on the diffraction or scattering of light from the surface.
Characterization Spectral analysis and imaging
Digital holographic microscope
Lyncée Tec DHM R2104 with sample stage heating control + self-built interference lithography addition (488 nm).
Characterization Surface and shape analysis
Digital holographic microscopy and interference lithography
Digital holographic microscopy (DHM) is a quantitative phase imaging technique, where both the amplitude and phase of light interacting with a sample are measured. The phase contains information on the height and refractive index variations on a sample. In the…
Characterization Material and thin film characterization
Electron spectroscopy
The Multilab/Argus Electron Spectrometer includes instruments for Selected-area and Imaging X-ray Photoelectron Spectroscopy (SAXPS/iXPS). The UHV system is modular including also preparation chambers equipped with various in situ sample preparation and fabrication facilities.
Characterization Light sources
Femtosecond systems
Femtosecond lasers create trains of sub pico-second pulses, at various repetition rates and pulse energies. They usually have good mode quality and high temporal stability.
Characterization Light sources
Fiber lasers
Fiber lasers usually offer small size and user-friendly operation, especially when used in fiber-based experiments. They can be designed to operate in all pulse duration regimes.
Characterization Spectral analysis and imaging
Fluorescence lifetime imaging microscope
Fluorescence lifetime imaging microscope MicroTime 200 (PicoQuant) with inverted microscope IX 73 from Olympus with custom made incubator.
Characterization Material and thin film characterization
Fourier Transform Optical Spectral Analyzer (FT-OSA)
Thorlabs OSA202COptical Spectrum Analysers (OSA) is a general-purpose spectrum analyzer for optical research, allowing fast and precise measurements over a wide spectral range.
Characterization Light source characterization