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Characterization Electron spectroscopy for surface analysis


The Scienta Omicron NanoESCA surface analysis instrument is a modular ultrahigh vacuum system combining spectromicroscope and in-situ sample preparation techniques. The spectromicroscope is an energy-filtering photoemission electron microscope (PEEM) with techniques: PES, XPS, UPS, PEEM, EF-PEEM, and momentum microscopy. The non filtered PEEM and spectroscopic energy filtered PEEM parts of the instrument include imaging detectors consisting of microchannel plates for electron signal amplification, fluorescent screens for signal conversion, and CCD camera for image recording.


Location: Tampere University (TAU), Tampere
Contact person: Kimmo Lahtonen (Tampere)

Services at TAU in Tampere (Contact person Kimmo Lahtonen)


Measurement methods

  • Photoemission Electron Microscopy (PEEM)
  • Energy Filtered Photoemission Electron Microscopy (EF-PEEM)
  • X-ray Photoelectron Spectroscopy (XPS), e.g., for measurement of surface and interface composition
  • Imaging X-ray Photoelectron Spectroscopy (iXPS)
  • Ultraviolet Photoelectron Spectroscopy (UPS), e.g., for measurement of workfunction
  • Imaging Ultraviolet Photoelectron Spectroscopy (iUPS)
  • Selected area small spot spectroscopy
  • Reciprocal space imaging

Sample preparation methods

  • Sputtering for sample cleaning
  • Resistive annealing up to 1000 °C for sample bulk cleaning, segregation, desorption
  • Controlled gas exposures for oxidation/reduction
  • Atomic hydrogen cracker

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