thin films - FinnLight

Refractive index and thin film thickness characterization

The service includes ellipsometry and prism coupler techniques.

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Atomic layer deposition

Picosun Sunale ALD R200 Advanced reactor for deposition of thin films

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Metricon

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Reflection and transmission simulation for planar thin-film stacks

Numerical design of AR, HR and other thin-film coatings

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Refractive index and thin film thickness characterization

The service includes ellipsometry and prism coupler techniques.

More info