Siirry sisältöön
Characterization Material and thin film characterization

Inverted microscope with imaging spectrophotometer

inverted microscope

Zeiss Axio Observer inverted microscope, 0x 0.45NA objective.

Details

Location: Tampere University (TAU), Tampere
Contact person: Suvi Lehtimäki (Tampere)
Info:

Zeiss Axio Observer inverted microscope, 0x 0.45NA objective. Halogen lamps for transmission and reflection measurements. Option for laser input (355 nm 10Hz nanosecond pump laser + wavelength tunable output from an OPO). The microscope is set up with an Andor Shamrock 303i spectrometer with a CCD camera, for angle-resolved measurements (spatially resolved spectra possible). Wavelength range of the spectrometer 300-1000nm.

Send an enquiry

"*" indicates required fields

Hidden
This field is for validation purposes and should be left unchanged.