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Characterization Material and thin film characterization

Spectroscopic material characterization

The service includes various techniques to characterize material properties.  


Location: University of Eastern Finland (UEF), Joensuu
Contact person: Sari Suvanto (Joensuu)

We have spectrophotometers, fluorescence spectrophotometers, and RAMAN spectrometers to use to investigate the optical, chemical, and molecular properties of materials.

Our equipment:

  • Edinburgh Instruments FLS-100 fluorescence spectrometer, light sources; Xenon lamp (450 W), 230 – 1000 nm, µF2 (60W) microsecond flashlamp: optical pulse 1,5µs to 2.5µs, repetition rate 0.1 Hz-100 Hz, and EPL-375 picosecond pulsed diode laser: 275 (±5) nm, measurement range 200 – 980 nm
  • Bruker Vertex 70 FTIR spectrometer, spectral range 650 – 4000 1/cm
  • Renishaw InVia Reflex confocal Raman microscope, excitation lasers 514 nm and 785 nm, measurement range 100 – 3200 1/cm
  • Perkin Elmer Lambda 900 UV/VIS/NIR spectrophotometer, spectral range 200 – 3300 nm

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