Services and tools to test the thermal characteristics of photonic components
Details
Location:
VTT, Espoo, Oulu
Contact persons:
Markku Alamäki (Oulu), Ben Wälchli (Espoo)
Wavelength:
SWIR (1.2 µm - 2.5 µm), MWIR (2.5 µm - 7 µm), LWIR (7 µm - 20 µm)
Info:
Thermal resistance measurements with Simcenter T3STER (in Oulu)
Contact person: Markku Alamäki at VTT
Advanced non-destructive transient thermal tester for thermal characterization of packaged semiconductor devices (diodes, BJTs, power MOSFETs, IGBTs, power LEDs) and multi-die devices, capable of testing components in situ.Thermal
https://edadirect.com/product/simcenter-t3ster/
Thermal camera imaging (in Espoo)
Contact person: Ben Wälchli at VTT
Thermal cameras can be used to analyze and image heat distribution in photonic components. Depending on required resolution and speed, different imagers can be used:
- Fluke Ti 32
- FLIR A6700
- Cedip Titanium 560M (located in Kuopio)
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