Methods and tools that scan the surface with a small tip. Includes AFM and SNOM tools.
Scanning probe microscopy (SPM) includes several different microscopy techniques which have in common that sharp tip or sensor is placed near the sample surface in interaction with it and sample position under is scanned over area of interest. Typical examples of SPM tools are atomic force microscopes (AFM) and scanning near-field optical microscopes (SNOM). At best, SPM offers atomic level resolution and can provide quantitative microscopic 2.5D images.
Scanning Probe Microscopy at VTT in Espoo
Services in MIKES (Contact person: Virpi Korpelainen)
Our equipment and services include traceable measurements and characterizations with::
- Interferometrically Traceable Metrology Atomic Force Microscope (IT-MAFM)
- Jupiter XR AFM, https://finfocus.fi/media/tuoteliitteet/679/Jupiter-XR-brochure-web-1OCT2019.pdf
Services in Micronova (Contact person: Sami Ylinen)
Our equipment include:
- Jupiter XR AFM, in clean room at Micronova. https://finfocus.fi/media/tuoteliitteet/679/Jupiter-XR-brochure-web-1OCT2019.pdf
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