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Characterization Surface and shape analysis

Scanning Probe Microscopy

Atomic Force Microscope

Methods and tools that scan the surface with a small tip. Includes AFM and SNOM tools.


Location: VTT, Espoo
Contact persons: Virpi Korpelainen (Espoo), Sami Ylinen (Espoo)

Scanning probe microscopy (SPM) includes several different microscopy techniques which have in common that sharp tip or sensor is placed near the sample surface in interaction with it and sample position under is scanned over area of interest. Typical examples of SPM tools are atomic force microscopes (AFM) and scanning near-field optical microscopes (SNOM). At best, SPM offers atomic level resolution and can provide quantitative microscopic 2.5D images.

Scanning Probe Microscopy at VTT in Espoo

Services in MIKES (Contact person: Virpi Korpelainen)

Our equipment and services include traceable measurements and characterizations with::

Services in Micronova (Contact person: Sami Ylinen)

Our equipment  include:

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