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Nonlinear Optical (NLO) Microscope


Location: Tampere University (TAU), Tampere
Contact person: Godofredo Bautista (Tampere)

The nonlinear optical (NLO) microscope can be used to noninvasively detect, investigate and spatially map the NLO responses of nanostructures (e.g., metal, semiconductor, biological, etc.). The image contrast mechanisms involve second-harmonic generation (SHG), third-harmonic generation (THG), and/or multiphoton luminescence (MPL). Other features include:

  • Powered by a broadband femtosecond laser (680 to 1300 nm, 140 fs, 80 MHz)
  • 3D point scanning and mapping with max range of 75 by 75 by 50 microns
  • High numerical aperture (NA) objectives (air or immersion)
  • Two PMT channel for epi-detection of SHG, THG, and/or MPL signals
  • Variable input beam polarizations and/or shapes, e.g., linear, circular, vector beams, Bessel, etc.

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