Siirry sisältöön
Characterization Light source characterization

Beam profile characterization


Location: Tampere University (TAU), VTT, Oulu, Tampere
Contact persons: Piotr Ryczkowski (Tampere), Mikko Närhi (Tampere), Noora Heinilehto (Oulu)
Wavelength: VIS (400 nm - 700 nm), SWIR (1.2 µm - 2.5 µm), NIR (700 nm - 1200 nm)

Cameras can be used to measure beam shapes locally or measure low amounts of light in microscopy and spectroscopic measurements. M2 measurement provides an ISO standardized quantity for the quality of the beam describing how close to an ideal beam it is. Polarimeters provide the polarization state of light in the Poincare sphere and degree of polarization of input light.

  • Andor Zyla 5.5, 5.5 Mpix sCMOS camera, 100fps (camera link),low noise, 6.5um pixel, 22mm diagonal, 12 and 16 bit modes, 0.9 e readout noise
  • Andor iXon 3, EMCCD camera, capable of single photon detection, 512 x 512 pixels, 16 um pixel, 12 bit, 400nm – 1100 nm (contact Mikko Närhi)
  • Owl640 COTS II (Raptor Photonics), In-Ga-As camera, 640×512 pixels, 15 um pixel size, 400-1700 nm sensitivity range
  • Pyrocam III HR (Ophir), Beam profiling camera, Pyroelectric Array 160×160 pixels, pixel pitch 80 um, spectral range 1060- 3000 nm and 3000-5000 nm
  • Polarimeter, ThorLabs PAX1000IR1/M (contact Mikko Närhi)
  • ThorLabs M2 measurement system with Dual Slit Beam Profiler, 500 – 1700 nm (contact Mikko Närhi)
  • Ophir BeamSquared M2 measurement, camera based, attenuating beam sampler allows measurements for powers > 100 W (contact Mikko Närhi)

Send an enquiry

"*" indicates required fields

Select recipient for your enquiry:

This field is for validation purposes and should be left unchanged.