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# FinnLight

Finnish Research Infrastructure on Light-Based Technologies

## Sitemaps

- [XML Sitemap](https://finnlight.fi/sitemap.xml): Contains all public & indexable URLs for this website.

## Posts

- [News](https://finnlight.fi/news/)

## Pages

- [Home](https://finnlight.fi/) - FinnLight photonics infrastructure platform is accessible to high-impact and cutting-edge science and industrial actors. It provides a comprehensive photonics technologies and service research.
- [About Finnlight](https://finnlight.fi/about-finnlight/) - FinnLight is a consortium between Tampere University, VTT and University of Eastern Finland offering unique expertise and infrastructure services for research, development, and innovation in Photonics. The infrastructure and services cover the whole innovation value chain from the development of materials and structures with specific optics properties, to the fabrication of fully functional photonic devices
- [Cookie Statement](https://finnlight.fi/cookies/)
- [Privacy Notice](https://finnlight.fi/privacynotice/) - Who are we? Our website address is: https://finnlight.fi Comments When website visitors leave comments on site's contact forms, we collect the information written on the form, visitor's IP address and browser version data for better identifying spam messages. Anonymized hash from email address can be sent to Gravatar Service in order to verify that the
- [Open Publishing and Data Policy](https://finnlight.fi/open-publishing-and-data-policy/) - Welcome to use the facilities and tools of FinnLight. Both academic and industrial experts are qualified in getting the access. FinnLight FinnLight’s access policy follows the guidelines set in ”European Charter for Access to Research Infrastructures”. The full access policy will be published later, but is based on the open access principles of FinnLight: Access
- [Thank you for your message](https://finnlight.fi/kiitos-viestistasi/) - Thank you for your message! We will be in touch with you as soon as possible! FinnLight
- [Contact](https://finnlight.fi/contact/) - Head organisation of FinnLight infrastructure consortium: Tampere University (TAU)Korkeakoulunkatu 733720 TampereFINLANDTel. +358 29 452 11 Research Infrastructure Director: Goëry Genty, Directorgoery.genty@tuni.fi Other participating research organisations (consortium parties): University of Eastern Finland (UEF)Neulaniementie 470210 KuopioFINLANDTel. +358 29 445 1111 Main contact: Markku Kuittinen, Local Managermarkku.kuittinen@uef.fi VTT Technical Research Centre of Finland (VTT)Kivimiehentie 302040 ESPOOFINLANDTel. +358 20
- [Instructions to Use](https://finnlight.fi/instructions-to-use/)
- [Partners](https://finnlight.fi/about-finnlight/partners/) - Photonics research in Finland is on world-class level, with many researchers recognized internationally that have received distinctions. The success in photonics research was acknowledged by the Academy of Finland and included in its Flagship program13 launched in 2018 intended as a pillar of its research and science policy. The Flagship for Photonics Research and Innovation

## Contact persons

- [Jae-Wung Lee](https://finnlight.fi/contact_persons/jae-wung-lee/)
- [Giovanni Delrosso](https://finnlight.fi/contact_persons/giovanni-delrosso/)
- [Virpi Korpelainen](https://finnlight.fi/contact_persons/virpi-korpelainen/)
- [Jeremias Seppä](https://finnlight.fi/contact_persons/jeremias-seppa/)
- [Antti Brunström](https://finnlight.fi/contact_persons/antti-brunstrom/)
- [Essi Sariola-Leikas](https://finnlight.fi/contact_persons/essi-sariola-leikas/)
- [Suvi Lehtimäki](https://finnlight.fi/contact_persons/suvi-lehtimaki/)
- [Tapani Vehmas](https://finnlight.fi/contact_persons/tapani-vehmas/)
- [Ben Wälchli](https://finnlight.fi/contact_persons/ben-walchli/)
- [Markku Alamäki](https://finnlight.fi/contact_persons/markku-alamaki/)
- [Aki Mäyrä](https://finnlight.fi/contact_persons/aki-mayra/)
- [Mikko Harjanne](https://finnlight.fi/contact_persons/mikko-harjanne/)
- [Markku Kapulainen](https://finnlight.fi/contact_persons/markku-kapulainen/)
- [Jarno Petäjä](https://finnlight.fi/contact_persons/jarno-petaja/)
- [Sami Ylinen](https://finnlight.fi/contact_persons/sami-ylinen/)
- [Noora Heinilehto](https://finnlight.fi/contact_persons/noora-heinilehto/)
- [Jaska Paaso](https://finnlight.fi/contact_persons/jaska-paaso/)
- [Markku Lahti](https://finnlight.fi/contact_persons/markku-lahti/)
- [Tapio Vaarala](https://finnlight.fi/contact_persons/tapio-vaarala/)
- [Antti Tanskanen](https://finnlight.fi/contact_persons/antti-tanskanen/)
- [Antti Lassila](https://finnlight.fi/contact_persons/antti-lassila-2/)
- [Jari Havisto](https://finnlight.fi/contact_persons/jari-havisto/)
- [Teemu Sipola](https://finnlight.fi/contact_persons/teemu-sipola/)
- [Kaisa-Leena Väisänen](https://finnlight.fi/contact_persons/kaisa-leena-vaisanen/)
- [Thomas Kraft](https://finnlight.fi/contact_persons/thomas-kraft/)
- [Mari Ylikunnari](https://finnlight.fi/contact_persons/mari-ylikunnari/)
- [Hannu Lindström](https://finnlight.fi/contact_persons/hannu-lindstrom/)
- [Sami Siikanen](https://finnlight.fi/contact_persons/sami-siikanen/)
- [Eero Hietala](https://finnlight.fi/contact_persons/eero-hietala/)
- [Jyrki Ollila](https://finnlight.fi/contact_persons/jyrki-ollila/)
- [Markku Keinänen](https://finnlight.fi/contact_persons/markku-keinanen/)
- [Dmitry Semenov](https://finnlight.fi/contact_persons/dmitry-semenov/)
- [Sari Suvanto](https://finnlight.fi/contact_persons/sari-suvanto/)
- [Jarkko Leskinen](https://finnlight.fi/contact_persons/jarkko-leskinen/)
- [Pertti Pääkkönen](https://finnlight.fi/contact_persons/pertti-paakkonen/)
- [Petri Karvinen](https://finnlight.fi/contact_persons/petri-karvinen/)
- [Godofredo Bautista](https://finnlight.fi/contact_persons/godofredo-bautista/)
- [Laeticia Petit](https://finnlight.fi/contact_persons/laeticia-petit/)
- [Juha Toivonen](https://finnlight.fi/contact_persons/juha-toivonen/)
- [Markku Kuittinen](https://finnlight.fi/contact_persons/markku-kuittinen/)
- [Piotr Ryczkowski](https://finnlight.fi/contact_persons/piotr-ryczkowski/)
- [Mikko Närhi](https://finnlight.fi/contact_persons/mikko-narhi/)
- [Antti Tukiainen](https://finnlight.fi/contact_persons/antti-tukiainen/)
- [Jukka Viheriälä](https://finnlight.fi/contact_persons/jukka-viheriala/)
- [Kimmo Lahtonen](https://finnlight.fi/contact_persons/kimmo-lahtonen/)
- [Kristiina Pispala](https://finnlight.fi/contact_persons/kristiina-pispala/)
- [Firstname Lastname](https://finnlight.fi/contact_persons/firstname-lastname/)

## Sivun alapalkki

- [Sivun alapalkki](https://finnlight.fi/page-footer/automaattinen-luonnos/) - Finnish Research Infrastructure on Light-Based Technologies. Sitemap Contact information Tampere University (TAU), FinnLight Director Goëry Genty University of Eastern Finland (UEF), Local Manager Markku Kuittinen VTT Technical Research Centre of Finland Ltd (VTT), Local Manager Timo Aalto

## Service

- [Spectroscopic material characterization](https://finnlight.fi/service/spectroscopic-material-characterization/) - The service includes various techniques to characterize material properties.
- [Laser pulse length measurements](https://finnlight.fi/service/laser-pulse-length-measurements/)
- [Gsolver optics software](https://finnlight.fi/service/gsolver/)
- [Metricon](https://finnlight.fi/service/metricon/)
- [Beam Analyzer with M2, Thorlabs](https://finnlight.fi/service/beam-analyzer-with-m2-thorlabs/)
- [Optical lithography and nano imprint lithography](https://finnlight.fi/service/optical-lithography/) - Top side UV-lithography, Bottom side UV-lithography, Micro and nanoimprint lithography (SMILE), UV-bonding
- [Molecular beam epitaxy](https://finnlight.fi/service/molecular-beam-epitaxy/) - We host five molecular beam epitaxy (MBE) systems equipped for the growth of all common GaAs, InP, and GaSb-based materials as well as more exotic III-V compounds.
- [Electron Beam Lithography, EBL](https://finnlight.fi/service/micro-and-nanopatterning/) - We offer the entire fabrication chain or a portion, such as e-beam patterning, according to the customer's design.
- [Photonics module packaging and sealing](https://finnlight.fi/service/photonics-module-packaging-and-sealing/) - Module-level packaging and sealing for photonic components
- [Multiphysics simulation with COMSOL](https://finnlight.fi/service/comsol-multiphysics/) - COMSOL software includes modules for simulating electromagnetic waves and fields, as well as mechanical forces, stress etc.
- [Design of photonic integrated circuits (PICs)](https://finnlight.fi/service/lumerical-software/) - Design services for complete photonic integrated circuits (PICs) with active and passive elements
- [Illumination design](https://finnlight.fi/service/illumination-design/) - FinnLight offers services for illumination design, including the design of light sources, illumination optics and illumination of any object or space.
- [Lens characterization](https://finnlight.fi/service/image-science-mtf-modulation-transfer-functionmodulation-transfer-functionimage-science-mtf-modulation-transfer-function/) - Services and tools for characterizing optical lenses
- [Electron spectroscopy](https://finnlight.fi/service/electron-spectroscopy/) - The Multilab/Argus Electron Spectrometer includes instruments for Selected-area and Imaging X-ray Photoelectron Spectroscopy (SAXPS/iXPS). The UHV system is modular including also preparation chambers equipped with various in situ sample preparation and fabrication facilities.
- [Design of active waveguide components](https://finnlight.fi/service/design-of-active-waveguide-components/) - Design services for amplifiers, lasers, modulators, detectors and other active components
- [Design of optical fibers](https://finnlight.fi/service/design-of-optical-fibers/) - Design services for passive and active fibers and fiber components
- [Design of waveguide coupling interfaces](https://finnlight.fi/service/epiprop-software/) - Design services for waveguide input/output coupling, including free-space interfaces
- [Spin coating](https://finnlight.fi/service/optispin-sst20/) - Spin coating is a method to apply a uniform film onto a solid surface by using centrifugal force and requires a liquid–vapor interface.
- [Thermal Treatment under Pressure](https://finnlight.fi/service/thermal-treatment-under-pressure/)
- [Thermal Treatment](https://finnlight.fi/service/thermal-treatment/)
- [Single Photon Detectors and Time Tagging Unit](https://finnlight.fi/service/single-photon-detectors-and-time-tagging-unit/)
- [Nonlinear Optical (NLO) Microscope](https://finnlight.fi/service/nonlinear-optical-nlo-microscope/)
- [Density Measurement](https://finnlight.fi/service/density-measurement/)
- [Photonic glasses](https://finnlight.fi/service/photonic-glasses/) - We host various tools for fabrication of photonic glass materials.
- [Laser sources](https://finnlight.fi/service/laser-sources-at-tuni/)
- [Characterization of epitaxial materials](https://finnlight.fi/service/characterization-of-epitaxial-materials/) - We host multiple research instruments and methods for characterization of epitaxial material properties.
- [SiO2 and SiN deposition using plasma enhanced CVD (PECVD)](https://finnlight.fi/service/sio2-and-sin-deposition-using-plasma-enhanced-cvd-pecvd/) - Two Plasmalab 80+ Plasma Enhanced Chemical Vapor Deposition systems (PECVDs) (Oxford Plasma Technology, 2000) are used for thin film growths and plasma treatments. Normal process temperature is 300 °C and the operatable range is from room temperature to 400 °C. The systems are differentiated as ‘left’ and ‘right’ and are dedicated for SiNx and SiO2
- [Flip-chip bonding with sub-micrometer accuracy](https://finnlight.fi/service/flip-chip-bonding-with-sub-micrometer-accuracy/) - Most demanding flip-integration with sub-micron accuracy is needed for e.g. waveguide-waveguide coupling
- [Die bonding and pick-and-place assembly](https://finnlight.fi/service/die-bonding-and-pick-and-place-assembly/) - Bonding of dies and chips on both planar and flexible substrates (excluding sub-micron flip-chip)
- [Characterization of waveguide components](https://finnlight.fi/service/characterization-of-photonic-and-optoelectronic-components/) - Services and tools for the testing of optical waveguide chips and circuits
- [Wafer-level testing](https://finnlight.fi/service/wafer-level-testing/) - Probe stations for the testing of passive and active optical components on wafer- and chip-level.
- [Scanning Probe Microscopy](https://finnlight.fi/service/scanning-probe-microscopy/) - Methods and tools that scan the surface with a small tip. Includes AFM and SNOM tools.
- [Optical surface profilometry](https://finnlight.fi/service/contourgt-x-surface-profiler/) - Optical profilometers enable contactless measurement of surfaces.
- [Mechanical surface profilometry](https://finnlight.fi/service/mechanical-surface-profilometry/) - Measuring sample surfaces with a contact probe is fast and accurate method for most surfaces.
- [Machine vision & co-ordinate measuring machines](https://finnlight.fi/service/machine-vision-co-ordinate-measuring-machines/) - Different machine vision tools and co-ordinate measuring machines (CMM) are useful e.g. in photonics assembly quality control.
- [Frequency and linewidth characterization](https://finnlight.fi/service/frequency-wavelength-linewidth-and-mode-structure-characterization/) - Understanding the laser beam properties is essential for many applications.
- [Diffractometry and scatterometry](https://finnlight.fi/service/diffractometry-and-scatterometry/) - Charaterization of surfaces based on the diffraction or scattering of light from the surface.
- [Solar cell characterization](https://finnlight.fi/service/solar-cell-characterization/) - Test services and tools for solar cell components and modules
- [Time-resolved spectroscopy characterization](https://finnlight.fi/service/time-resolved-spectroscopy-characterization/) - Picoharp 300 TCSPC emission decay measurements with time resolution down to 60 ps in the range 400-850 nm.
- [Inverted microscope with imaging spectrophotometer](https://finnlight.fi/service/inverted-microscope-with-imaging-spectrophotometer/) - Zeiss Axio Observer inverted microscope, 0x 0.45NA objective.
- [High speed camera](https://finnlight.fi/service/high-speed-camera/) - High-speed imaging system delivering superior image quality and sensitivity in a compact, lightweight and rugged camera design.
- [Fourier Transform Optical Spectral Analyzer (FT-OSA)](https://finnlight.fi/service/fourier-transform-optical-spectral-analyzer-ft-osa/) - Thorlabs OSA202COptical Spectrum Analysers (OSA) is a general-purpose spectrum analyzer for optical research, allowing fast and precise measurements over a wide spectral range.
- [Fluorescence lifetime imaging microscope](https://finnlight.fi/service/fluorescence-lifetime-imaging-microscope/) - Fluorescence lifetime imaging microscope MicroTime 200 (PicoQuant) with inverted microscope IX 73 from Olympus with custom made incubator.
- [Langmuir-Blodgett film deposition system with Brewster angle microscope](https://finnlight.fi/service/langmuir-blodgett-film-deposition-system-with-brewster-angle-microscope/) - The surface pressure area isotherms and Brewster angle microscope (BAM) images are measured simultaneously.
- [Precise diamond saw for wafer dicing and other applications](https://finnlight.fi/service/precise-diamond-saw-for-wafer-dicing-and-other-applications/) - Disco Automatic dicing saw model DAD3221 and connected to DTU162 water temperature control unit.
- [Reactive plasma etcher with fluorine chemistry (RIE)](https://finnlight.fi/service/reactive-plasma-etcher-with-fluorine-chemistry-rie-2/) - Advanced Vacuum Vision 320 RIE is a reactive ion etching device. Typical use cases are dry etching of thin films like SiN and SiO2 or oxygen plasma treatments to clean the substrates or to change the surface properties like hydrophilicity prior applying some thin film or bonding.
- [Direct writing lithography system](https://finnlight.fi/service/direct-writing-lithography-system/) - Heidelberg Instruments µPG-501 is a DLP-LED based maskless lithography system which can be used for three applications: Fabrication of photomasks, Maskless UV-lithography directly to wafers, and Grey-scale lithography.
- [Semi automatic wire bonder (Ball-wedge)](https://finnlight.fi/service/semi-automatic-wire-bonder-ball-wedge/) - West-Bond Model 454647E wire bonder is a semiautomatic system for making reproducible wire bonds with gold wire. System drives for both Y and Z axes bond a succession of parallel, single or multiple arched wires maintaining an identical loop and bond shapes that can be stored to a recipe. Bonding is achieved with ball-wedge bond
- [Surface plasma treatment system](https://finnlight.fi/service/surface-plasma-treatment-system/) - Diener Tetra-30-LF-PC is a plasma system is used mainly for surface treatments and cleaning of various substrates with O2-plasma. This plasma system works in mode opposite to RIE and therefore it does no bombard surface with ions. In general the system can't be used for etching because it is very slow and etch rate is non-uniform. It is,
- [Atomic layer deposition](https://finnlight.fi/service/atomic-layer-deposition/) - Picosun Sunale ALD R200 Advanced reactor for deposition of thin films
- [Substrate thinning and polishing system](https://finnlight.fi/service/substrate-thinning-and-polishing-system/) - Logitech PM5 precision lapping&polishing machine is a system for semiconductor wafer backside thinning.
- [Shear and pull tester for chips and wires](https://finnlight.fi/service/shear-and-pull-tester-for-chips-and-wires/) - Dage4000 Bondtester is a system for testing chip-to-chip and wire-to-chip bonds.
- [Precision assembly cell for mico- and fiber-optics](https://finnlight.fi/service/precision-assembly-cell-for-mico-and-fiber-optics/) - CustomLine CL1500 is the standalone assembly cell intended for active assembly tasks involving fibers or lenses.
- [Precise wafer dicing using scribe and break method](https://finnlight.fi/service/precise-wafer-dicing-using-scribe-and-break-method/) - Loomis LSD-100 scriber is a system for wafer dicing.
- [High precision automatic wire bonder (Ball-wedge, wedge-wedge, ribbon, stud bump)](https://finnlight.fi/service/high-precision-automatic-wire-bonder-ball-wedge-wedge-wedge-ribbon-stud-bump/) - K&S Maxµm Ultra Automatic Ball Bonder is an automatic system for making reproducible wire bonds with gold wire.
- [Rapid thermal annealing of semiconductor wafers (RTA / RTP)](https://finnlight.fi/service/rapid-thermal-annealing-of-semiconductor-wafers-rta-rtp/) - Jipelec Jetfirst100 is a rapid thermal annealing (RTA) system that can be used for thermal processing such as increasing/decreasing defects in crystalline materials, inducing phase changes etc.
- [Reactive plasma etcher with chlorine chemistry (ICP-RIE)](https://finnlight.fi/service/reactive-plasma-etcher-with-chlorine-chemistry-icp-rie/) - ICP Plasmalab 100 (Oxford Plasma Technology) is a ICP-RIE system (Inductively Coupled Plasma - Reactive-Ion Etching) used mainly for semiconductor dry etches using various soft and hard masks. There is also a separate RIE unit, but the advantage of ICP system is the separation of the plasma generation and the electric field accelerating the ions,
- [Reactive plasma etcher with fluorine chemistry (RIE)](https://finnlight.fi/service/reactive-plasma-etcher-with-fluorine-chemistry-rie/) - RIE Plasmalab 100 (Oxford Plasma Technology) is a RIE system (Reactive-Ion Etching) mainly used for dielectric and polymer dry etching using various soft and hard masks. There is also a separate (ICP-RIE) unit for processes where improved control of the process parameters is required (in ICP-RIE the plasma generation and the electric field accelerating the
- [Electron beam lithography equipment](https://finnlight.fi/service/electron-beam-lithography-equipment/) - STS-Elionix ELS-BODEN Electron beam lithography system
- [Anritsu pulse pattern generator](https://finnlight.fi/service/anritsu-pulse-pattern-generator/)
- [Keysight sampling oscilloscope](https://finnlight.fi/service/keysight-sampling-oscilloscope/)
- [Anritsu Vector network analyzer](https://finnlight.fi/service/anritsu-vector-network-analyzer/)
- [Advantest Bit error rate tester](https://finnlight.fi/service/advantest-bit-error-rate-tester/)
- [Bit-error-rate tester, 4 channels, Multilane ML4039](https://finnlight.fi/service/bit-error-rate-tester-4-channels-multilane-ml4039/)
- [Wide-Bandwidth sampling Oscilloscope, Agilent (Keysight) DCA-X 86100D](https://finnlight.fi/service/wide-bandwidth-sampling-oscilloscope-agilent-keysight-dca-x-86100d/)
- [Optical Spectral measurements](https://finnlight.fi/service/optical-spectral-measurements/)
- [Raman spectroscopy](https://finnlight.fi/service/raman-spectroscopy/) - Raman Spectroscopy constitutes a non-invasive analytical technique that furnishes intricate insights into chemical constitution, phase transitions, polymorphic variations, crystalline characteristics, and molecular interactions.
- [Polychromatic light sources](https://finnlight.fi/service/polychromatic-light-sources/) - Polychromatic light covers a specific range of wavelengths, and it can be used for spectral measurements.
- [Design of passive waveguide components](https://finnlight.fi/service/fimmwave-fimmprop-mode-solver/) - Design services for passive waveguide components, such as bends, splitters and wavelength filters
- [Contactless Rheometry for Soft Material Characterization](https://finnlight.fi/service/contactless-rheometry-for-soft-material-characterization/) - Elastosens Bio is a mechanical tester for hydrogels and biomaterials.
- [Stereo microscope](https://finnlight.fi/service/stereo-microscope/) - ZEISS SteREO Discovery.V12, 100x zoom, for 3D microscopy imaging.
- [Polarized optical microscope (POM)](https://finnlight.fi/service/polarized-optical-microscope-pom/) - Zeiss Axio Imager Pol polarized light microscope. Fitted with a regular rotating stage and a Linkam cooling/heating stage.
- [Digital holographic microscope](https://finnlight.fi/service/digital-holographic-microscope/) - Lyncée Tec DHM R2104 with sample stage heating control + self-built interference lithography addition (488 nm).
- [Micro-manipulating system](https://finnlight.fi/service/micro-manipulating-system/) - This home-made manipulating system is for local laser excitation, object transferring and positioning at the microscopic scale.
- [Perovskite solar cell fabrication](https://finnlight.fi/service/solution-processible-perovskite-solar-cell-fabrication/) - Two nitrogen-filled glove boxes (
- [Digital holographic microscopy and interference lithography](https://finnlight.fi/service/digital-holographic-microscopy-and-interference-lithography/) - Digital holographic microscopy (DHM) is a quantitative phase imaging technique, where both the amplitude and phase of light interacting with a sample are measured. The phase contains information on the height and refractive index variations on a sample. In the off-axis configuration, the hologram is created between light from a sample and a reference wavefront
- [Nanosecond systems](https://finnlight.fi/service/nanosecond-systems/) - Nanosecond laser systems can provide tens-of-mJ pulse energies and are often used for sample excitation, nonlinear phenomena study, material processing and LIBS measurements, often combined with frequency converters such as OPO or harmonic generators.
- [Fiber lasers](https://finnlight.fi/service/fiber-lasers/) - Fiber lasers usually offer small size and user-friendly operation, especially when used in fiber-based experiments. They can be designed to operate in all pulse duration regimes.
- [Femtosecond systems](https://finnlight.fi/service/femtosecond-systems/) - Femtosecond lasers create trains of sub pico-second pulses, at various repetition rates and pulse energies. They usually have good mode quality and high temporal stability.
- [Continuous wave](https://finnlight.fi/service/continuous-wave/) - Continuous wave lasers are emitting constant radiation usually with very small spectral bandwidth. They are often used for alignment and sensing purposes, if tunable, can be used for spectral measurements. In the most powerful versions, they are used as optical pumps for other stages of experiments.
- [Spectromicroscopy](https://finnlight.fi/service/photoemission-electron-microscopy-peem-and-spectromicroscopy/) - The Scienta Omicron NanoESCA surface analysis instrument is a modular ultrahigh vacuum system combining spectromicroscope and in-situ sample preparation techniques. The spectromicroscope is an energy-filtering photoemission electron microscope (PEEM) with techniques: PES, XPS, UPS, PEEM, EF-PEEM, and momentum microscopy. The non filtered PEEM and spectroscopic energy filtered PEEM parts of the instrument include imaging detectors
- [Ultraviolet photoelectron spectroscopy (UPS)](https://finnlight.fi/service/ultraviolet-photoelectron-spectroscopy-ups/)
- [X-ray photoelectron spectroscopy (XPS)](https://finnlight.fi/service/4791/) - The Scienta Omicron Argus Electron Spectrometer includes instruments for Selected-area and Imaging X-ray Photoelectron Spectroscopy (SAXPS/iXPS). The UHV system is modular including also preparation chambers equipped with in-situ sample preparation and fabrication facilities.
- [Optical near-field characterization](https://finnlight.fi/service/optical-near-field-characterization/) - Measurement of optical near fields from the surfaces of optical components
- [Laser safety analysis](https://finnlight.fi/service/laser-safety-analysis/) - Software and know-how to analyze the safety of lasers
- [Reflection and transmission simulation for planar thin-film stacks](https://finnlight.fi/service/filmwizard-software/) - Numerical design of AR, HR and other thin-film coatings
- [Optical Microscopy](https://finnlight.fi/service/optical-microscopy/) - Transmitted or reflected light microscopy.
- [Spectral imaging of plants](https://finnlight.fi/service/spectral-imaging-of-plants/) - The service includes various spectral imaging methods for plant imaging.
- [Spectral measurements and analysis](https://finnlight.fi/service/spectral-measurements-and-analysis/) - The service includes various spectral measurement and analysis methods.
- [Spectral imaging and analysis](https://finnlight.fi/service/spectral-imaging-and-analysis/) - The service includes several techniques for capturing images in such a way that each pixel of the image is recorded as a spectrum.
- [Lens and optical systems design](https://finnlight.fi/service/lenses-and-systems-designing/) - The service covers the design of lenses and optical systems.
- [Optical thin-film coating](https://finnlight.fi/service/optical-thin-film-coating/) - IBS NAVIGATOR 700 (Cutting Edge Coatings GmbH, 2016) is an optical coater designed for automatic coating of planar glass substrates. The system utilizes broadband optical monitoring (BBM) through monitor fused silica windows or layers can be deposited using time control.
- [Nextron Micro Probe test chamber](https://finnlight.fi/service/nextron-micro-probe-system/) - Test chamber enables electric measurements of a sample under controlled environment and illumination.
- [Diffractive Optics](https://finnlight.fi/service/diffractive-optics/) - The service includes both scalar and rigorous designing of diffractive optical elements.
- [Monochromatic light sources](https://finnlight.fi/service/monochromatic-light-sources/) - Monochromatic light sources (either continuous wave or pulsed) are commonly employed in the characterization of the functionality of optical elements and in a variety of optical measurements.
- [Subwavelength optics](https://finnlight.fi/service/subwavelength-optics/) - The service includes rigorous designing of metamaterials and plasmonic structures.
- [Spectrum analyzers](https://finnlight.fi/service/spectrum-analyzers/) - Spectrum analyzers are used to measure the power of an optical spectrum over a specified wavelength (frequency) span.
- [Cameras for various spectral ranges](https://finnlight.fi/service/cameras-for-various-spectral-ranges/) - Specialized cameras can be effectively employed to capture imagery across a multitude of application domains, spanning diverse spectral ranges.
- [Refractive index and thin film thickness characterization](https://finnlight.fi/service/refractive-index-and-thin-film-thickness-characterization/) - The service includes ellipsometry and prism coupler techniques.
- [Electron Microscopy](https://finnlight.fi/service/electron-microscopy/) - Electron microscopy utilizes an electron beam to study the properties of the sample. Includes scanning electron microscopy (SEM).
- [X-Ray sensors](https://finnlight.fi/service/x-ray-sensors-spellman-and-thermoscientific/)
- [Beam profile characterization](https://finnlight.fi/service/beam-profilers-cameras-polarimeters/)
- [Short pulse characterization](https://finnlight.fi/service/grenouille-frog-8-5/)
- [Phase modulators, waveshaper and SLMs](https://finnlight.fi/service/phase-modulators-waveshaper-and-slms/)
- [Oscilloscopes, signal generators and detectors](https://finnlight.fi/service/oscilloscopes-and-detectors/)
- [Fiber splicing](https://finnlight.fi/service/fiber-fusion-splicers/) - Permanently connecting fibers and fiber arrays together
- [Fiber alignment and pigtailing](https://finnlight.fi/service/precision-alignment-station-ficontec-custom/) - Fiber-waveguide alignment and permanent fiber pigtailing for photonic chips and modules
- [Thermal characterization of components](https://finnlight.fi/service/simcenter-t3ster/) - Services and tools to test the thermal characteristics of photonic components
- [LabVIEW programming environment](https://finnlight.fi/service/labview-programming-environment/)
- [Spectroscopic data analysis and data libraries](https://finnlight.fi/service/biorad-knowitall-spectral-library/) - Software tools to analyse spectral data, including libraries of spectroscopic data.
- [Miscellaneous optical component testing](https://finnlight.fi/service/alphareel-unwind-rewind-mg003/) - Other tools for testing optical and photonic components (in addition to other service cards)
- [Nanoimprint Lithography, NIL](https://finnlight.fi/service/nanoimprint-lithography-nil/) - We offer both master element fabrication and nanoimprint lithography services.

## Tags

- [ALD](https://finnlight.fi/tag/ald/)
- [Atomic layer deposition](https://finnlight.fi/tag/atomic-layer-deposition/)
- [oxides](https://finnlight.fi/tag/oxides/)
- [dielectrics](https://finnlight.fi/tag/dielectrics/)
- [antireflective coatings](https://finnlight.fi/tag/antireflective-coatings/)
- [multilayered structures](https://finnlight.fi/tag/multilayered-structures/)
- [coatings](https://finnlight.fi/tag/coatings/)
- [thin films](https://finnlight.fi/tag/thin-films/)
- [anatase](https://finnlight.fi/tag/anatase/)
- [rutile](https://finnlight.fi/tag/rutile/)
- [surface analysis](https://finnlight.fi/tag/surface-analysis/)
- [spectromicroscopy](https://finnlight.fi/tag/spectromicroscopy/)
- [XPS](https://finnlight.fi/tag/xps/)
- [UPS](https://finnlight.fi/tag/ups/)
- [PEEM](https://finnlight.fi/tag/peem/)
- [photoemission electron microscopy](https://finnlight.fi/tag/photoemission-electron-microscopy/)
- [ultraviolet photoelectron spectroscopy](https://finnlight.fi/tag/ultraviolet-photoelectron-spectroscopy/)
- [EF-PEEM](https://finnlight.fi/tag/ef-peem/)
- [chemical mapping](https://finnlight.fi/tag/chemical-mapping/)
- [spectrum analyzer](https://finnlight.fi/tag/spectrum-analyzer/)
- [spectum analyzer](https://finnlight.fi/tag/spectum-analyzer/)
- [spectrograph](https://finnlight.fi/tag/spectrograph/)
- [spectrometer](https://finnlight.fi/tag/spectrometer/)
- [monochromator](https://finnlight.fi/tag/monochromator/)
- [optical spectrum](https://finnlight.fi/tag/optical-spectrum/)
- [laser](https://finnlight.fi/tag/laser/)
- [ultrafast](https://finnlight.fi/tag/ultrafast/)
- [picosecond](https://finnlight.fi/tag/picosecond/)
- [femtosecond](https://finnlight.fi/tag/femtosecond/)
- [nanosecond](https://finnlight.fi/tag/nanosecond/)
- [fusion splicing](https://finnlight.fi/tag/fusion-splicing/)
- [fiber splicing](https://finnlight.fi/tag/fiber-splicing/)
- [optical fiber](https://finnlight.fi/tag/optical-fiber/)
- [vytran](https://finnlight.fi/tag/vytran/)
- [fitel](https://finnlight.fi/tag/fitel/)
- [autocorrelation](https://finnlight.fi/tag/autocorrelation/)
- [frequency resolved optical gating](https://finnlight.fi/tag/frequency-resolved-optical-gating/)
- [frog](https://finnlight.fi/tag/frog/)
- [pulse measurement](https://finnlight.fi/tag/pulse-measurement/)
- [oscilloscope](https://finnlight.fi/tag/oscilloscope/)
- [photodetector](https://finnlight.fi/tag/photodetector/)
- [beam profiler](https://finnlight.fi/tag/beam-profiler/)
- [beam shape](https://finnlight.fi/tag/beam-shape/)
- [polarimeter](https://finnlight.fi/tag/polarimeter/)
- [polarization](https://finnlight.fi/tag/polarization/)
- [signal generator](https://finnlight.fi/tag/signal-generator/)
- [prbs](https://finnlight.fi/tag/prbs/)
- [waveform generator](https://finnlight.fi/tag/waveform-generator/)
- [pulse generator](https://finnlight.fi/tag/pulse-generator/)
- [waveshaper](https://finnlight.fi/tag/waveshaper/)
- [phase modulator](https://finnlight.fi/tag/phase-modulator/)
- [intensity modulator](https://finnlight.fi/tag/intensity-modulator/)
- [spatial light modulator](https://finnlight.fi/tag/spatial-light-modulator/)
- [slm](https://finnlight.fi/tag/slm/)
- [wave analysis](https://finnlight.fi/tag/wave-analysis/)
- [grating design](https://finnlight.fi/tag/grating-design/)
- [eye safety](https://finnlight.fi/tag/eye-safety/)
- [power](https://finnlight.fi/tag/power/)
- [lenses](https://finnlight.fi/tag/lenses/)
- [Illumination](https://finnlight.fi/tag/illumination/)
- [Ray tracing](https://finnlight.fi/tag/ray-tracing/)
- [FEM](https://finnlight.fi/tag/fem/)
- [Modelling](https://finnlight.fi/tag/modelling/)
- [Multi-Physics](https://finnlight.fi/tag/multi-physics/)
- [Design](https://finnlight.fi/tag/design/)
- [Gratings](https://finnlight.fi/tag/gratings/)
- [nanoimprint lithography](https://finnlight.fi/tag/nanoimprint-lithography/)
- [Photonics packaging](https://finnlight.fi/tag/photonics-packaging/)
- [optics alignment](https://finnlight.fi/tag/optics-alignment/)
- [R2R](https://finnlight.fi/tag/r2r/)
- [High-volume](https://finnlight.fi/tag/high-volume/)
- [Automated assembly](https://finnlight.fi/tag/automated-assembly/)
- [Hermetic](https://finnlight.fi/tag/hermetic/)
- [Vacuum](https://finnlight.fi/tag/vacuum/)
- [Encapsulation](https://finnlight.fi/tag/encapsulation/)
- [spectrophotometer](https://finnlight.fi/tag/spectrophotometer/)
- [Raman spectroscopy](https://finnlight.fi/tag/raman-spectroscopy/)
- [MTF](https://finnlight.fi/tag/mtf/)
- [quality testing](https://finnlight.fi/tag/quality-testing/)
- [Luminaires](https://finnlight.fi/tag/luminaires/)
- [Thermal resistance](https://finnlight.fi/tag/thermal-resistance/)
- [solar cells](https://finnlight.fi/tag/solar-cells/)
- [solar simulator](https://finnlight.fi/tag/solar-simulator/)
- [automation](https://finnlight.fi/tag/automation/)
- [data analysis](https://finnlight.fi/tag/data-analysis/)
- [Multivariate analysis](https://finnlight.fi/tag/multivariate-analysis/)
- [Raman analysis](https://finnlight.fi/tag/raman-analysis/)
- [Spectral analysis](https://finnlight.fi/tag/spectral-analysis/)
- [prediction engine](https://finnlight.fi/tag/prediction-engine/)
- [PCA](https://finnlight.fi/tag/pca/)
- [PLS](https://finnlight.fi/tag/pls/)
- [OPLS](https://finnlight.fi/tag/opls/)
- [OPLS_DA](https://finnlight.fi/tag/opls_da/)
- [Nanostructure analysis](https://finnlight.fi/tag/nanostructure-analysis/)
- [surface profile](https://finnlight.fi/tag/surface-profile/)
- [light sources](https://finnlight.fi/tag/light-sources/)
- [signal analysis](https://finnlight.fi/tag/signal-analysis/)
- [communication system testing](https://finnlight.fi/tag/communication-system-testing/)
- [Quality inspection](https://finnlight.fi/tag/quality-inspection/)
- [Industry4.0](https://finnlight.fi/tag/industry4-0/)
- [x-ray spectroscopy](https://finnlight.fi/tag/x-ray-spectroscopy/)
- [x-ray imaging](https://finnlight.fi/tag/x-ray-imaging/)
- [SEM](https://finnlight.fi/tag/sem/)
- [Imaging](https://finnlight.fi/tag/imaging/)
- [coater](https://finnlight.fi/tag/coater/)
- [glass substrate](https://finnlight.fi/tag/glass-substrate/)
- [optical monitoring](https://finnlight.fi/tag/optical-monitoring/)
- [molecular beam epitaxy](https://finnlight.fi/tag/molecular-beam-epitaxy/)
- [MBE](https://finnlight.fi/tag/mbe/)
- [III-V compound](https://finnlight.fi/tag/iii-v-compound/)
- [Compound semiconductor](https://finnlight.fi/tag/compound-semiconductor/)
- [AM0](https://finnlight.fi/tag/am0/)
- [AM1.5D](https://finnlight.fi/tag/am1-5d/)
- [AM1.5G](https://finnlight.fi/tag/am1-5g/)
- [CPV](https://finnlight.fi/tag/cpv/)
- [concentrated photovoltaics](https://finnlight.fi/tag/concentrated-photovoltaics/)
- [Quantum efficiency](https://finnlight.fi/tag/quantum-efficiency/)
- [EQE](https://finnlight.fi/tag/eqe/)
- [VECSEL](https://finnlight.fi/tag/vecsel/)
- [VCSEL](https://finnlight.fi/tag/vcsel/)
- [edge-emitting laser](https://finnlight.fi/tag/edge-emitting-laser/)
- [characterization](https://finnlight.fi/tag/characterization/)
- [Characterisation](https://finnlight.fi/tag/characterisation/)
- [Near-IR](https://finnlight.fi/tag/near-ir/)
- [mid-IR](https://finnlight.fi/tag/mid-ir/)
- [photonic integration](https://finnlight.fi/tag/photonic-integration/)
- [optoelectronic devices](https://finnlight.fi/tag/optoelectronic-devices/)
- [high-speed devices](https://finnlight.fi/tag/high-speed-devices/)
- [high-power devices](https://finnlight.fi/tag/high-power-devices/)
- [x-ray diffraction](https://finnlight.fi/tag/x-ray-diffraction/)
- [photoluminescence](https://finnlight.fi/tag/photoluminescence/)
- [reflectance](https://finnlight.fi/tag/reflectance/)
- [Hall measurement](https://finnlight.fi/tag/hall-measurement/)
- [micro photoluminescence](https://finnlight.fi/tag/micro-photoluminescence/)
- [defects](https://finnlight.fi/tag/defects/)
- [DLTS](https://finnlight.fi/tag/dlts/)
- [spectrometry](https://finnlight.fi/tag/spectrometry/)
- [magnetocryostat](https://finnlight.fi/tag/magnetocryostat/)
- [electrochemical capacitance voltage](https://finnlight.fi/tag/electrochemical-capacitance-voltage/)
- [ECV](https://finnlight.fi/tag/ecv/)
- [LCR measurement](https://finnlight.fi/tag/lcr-measurement/)
- [Dark spot](https://finnlight.fi/tag/dark-spot/)
- [dispersive fourier transform](https://finnlight.fi/tag/dispersive-fourier-transform/)
- [optical glasses](https://finnlight.fi/tag/optical-glasses/)
- [density](https://finnlight.fi/tag/density/)
- [measurement](https://finnlight.fi/tag/measurement/)
- [thermal treatment](https://finnlight.fi/tag/thermal-treatment/)
- [refractive index measurement](https://finnlight.fi/tag/refractive-index-measurement/)
- [pressure](https://finnlight.fi/tag/pressure/)
- [time tagging](https://finnlight.fi/tag/time-tagging/)
- [photon detector](https://finnlight.fi/tag/photon-detector/)
- [superconducting](https://finnlight.fi/tag/superconducting/)
- [nanowire](https://finnlight.fi/tag/nanowire/)
- [photon](https://finnlight.fi/tag/photon/)
- [nonlinear](https://finnlight.fi/tag/nonlinear/)
- [microscope](https://finnlight.fi/tag/microscope/)
- [NLO](https://finnlight.fi/tag/nlo/)
- [spin developing](https://finnlight.fi/tag/spin-developing/)
- [microscopy](https://finnlight.fi/tag/microscopy/)
- [laser pulse characterization](https://finnlight.fi/tag/laser-pulse-characterization/)
- [micropatterning](https://finnlight.fi/tag/micropatterning/)
- [nanopatterning](https://finnlight.fi/tag/nanopatterning/)
- [surface shape](https://finnlight.fi/tag/surface-shape/)
- [surface roughness](https://finnlight.fi/tag/surface-roughness/)
- [spectral imaging](https://finnlight.fi/tag/spectral-imaging/)
- [colour research](https://finnlight.fi/tag/colour-research/)
- [spectral data analysis](https://finnlight.fi/tag/spectral-data-analysis/)
- [spectromics](https://finnlight.fi/tag/spectromics/)
- [plant imaging](https://finnlight.fi/tag/plant-imaging/)
- [scatterometry](https://finnlight.fi/tag/scatterometry/)
- [ellipsometry](https://finnlight.fi/tag/ellipsometry/)
- [electrical measurements](https://finnlight.fi/tag/electrical-measurements/)
- [optical systems](https://finnlight.fi/tag/optical-systems/)
- [electron spectroscopy](https://finnlight.fi/tag/electron-spectroscopy/)
- [diffraction](https://finnlight.fi/tag/diffraction/)
- [nanophotonics](https://finnlight.fi/tag/nanophotonics/)
- [subwavelenght](https://finnlight.fi/tag/subwavelenght/)
- [designing](https://finnlight.fi/tag/designing/)
- [component characterization](https://finnlight.fi/tag/component-characterization/)
- [electron beam lithography](https://finnlight.fi/tag/electron-beam-lithography/)
- [master elements](https://finnlight.fi/tag/master-elements/)
- [prism coupler](https://finnlight.fi/tag/prism-coupler/)
- [spectroscopy](https://finnlight.fi/tag/spectroscopy/)
- [material characterization](https://finnlight.fi/tag/material-characterization/)
- [fluorescence spectroscopy](https://finnlight.fi/tag/fluorescence-spectroscopy/)
- [spectral measurements](https://finnlight.fi/tag/spectral-measurements/)
- [spectral measurments](https://finnlight.fi/tag/spectral-measurments/)
- [Quantitative Microscopy](https://finnlight.fi/tag/quantitative-microscopy/)
- [AFM](https://finnlight.fi/tag/afm/)
- [SNOM](https://finnlight.fi/tag/snom/)
- [TEM](https://finnlight.fi/tag/tem/)
- [Diffractive optical elements](https://finnlight.fi/tag/diffractive-optical-elements/)
- [Diffractometry](https://finnlight.fi/tag/diffractometry/)
- [Co-ordinate measurment](https://finnlight.fi/tag/co-ordinate-measurment/)
- [CMM](https://finnlight.fi/tag/cmm/)
- [Vision CMM](https://finnlight.fi/tag/vision-cmm/)
- [freeform](https://finnlight.fi/tag/freeform/)
- [optical microscopy](https://finnlight.fi/tag/optical-microscopy/)
- [contact probe](https://finnlight.fi/tag/contact-probe/)
- [frequency](https://finnlight.fi/tag/frequency/)
- [wavelength](https://finnlight.fi/tag/wavelength/)
- [linewidth](https://finnlight.fi/tag/linewidth/)
- [m2](https://finnlight.fi/tag/m2/)
- [bpp](https://finnlight.fi/tag/bpp/)
- [emccd](https://finnlight.fi/tag/emccd/)
- [scmos](https://finnlight.fi/tag/scmos/)
- [frequency comb](https://finnlight.fi/tag/frequency-comb/)
- [wavemeter](https://finnlight.fi/tag/wavemeter/)
- [camera](https://finnlight.fi/tag/camera/)
- [optical](https://finnlight.fi/tag/optical/)
- [NanoESCA](https://finnlight.fi/tag/nanoesca/)
- [workfuction mapping](https://finnlight.fi/tag/workfuction-mapping/)
- [surface treatments](https://finnlight.fi/tag/surface-treatments/)
- [imaging XPS](https://finnlight.fi/tag/imaging-xps/)
- [mode-locked](https://finnlight.fi/tag/mode-locked/)
- [fiber mode-locked](https://finnlight.fi/tag/fiber-mode-locked/)
- [regenerative amplified](https://finnlight.fi/tag/regenerative-amplified/)
- [wave laser](https://finnlight.fi/tag/wave-laser/)
- [radiation](https://finnlight.fi/tag/radiation/)
- [spectral bandwidth](https://finnlight.fi/tag/spectral-bandwidth/)
- [sensing](https://finnlight.fi/tag/sensing/)
- [optical pump](https://finnlight.fi/tag/optical-pump/)
- [continuous wave](https://finnlight.fi/tag/continuous-wave/)
- [fiber laser](https://finnlight.fi/tag/fiber-laser/)
- [NIR spectral range](https://finnlight.fi/tag/nir-spectral-range/)
- [keopsys](https://finnlight.fi/tag/keopsys/)
- [holographic microscopy](https://finnlight.fi/tag/holographic-microscopy/)
- [interference lithography](https://finnlight.fi/tag/interference-lithography/)
- [inverted](https://finnlight.fi/tag/inverted/)
- [solution-processible](https://finnlight.fi/tag/solution-processible/)
- [perovskite](https://finnlight.fi/tag/perovskite/)
- [solar cell](https://finnlight.fi/tag/solar-cell/)
- [digital holographic microscope](https://finnlight.fi/tag/digital-holographic-microscope/)
- [film deposition](https://finnlight.fi/tag/film-deposition/)
- [angle microscope](https://finnlight.fi/tag/angle-microscope/)
- [micro-manipulating](https://finnlight.fi/tag/micro-manipulating/)
- [laser excitation](https://finnlight.fi/tag/laser-excitation/)
- [object transferring](https://finnlight.fi/tag/object-transferring/)
- [object positioning](https://finnlight.fi/tag/object-positioning/)
- [polarized optical](https://finnlight.fi/tag/polarized-optical/)
- [stereo microscope](https://finnlight.fi/tag/stereo-microscope/)
- [fluorescence microscope](https://finnlight.fi/tag/fluorescence-microscope/)
- [lifetime imaging](https://finnlight.fi/tag/lifetime-imaging/)
- [high speed camera](https://finnlight.fi/tag/high-speed-camera/)
- [time-resolved spectroscopy](https://finnlight.fi/tag/time-resolved-spectroscopy/)
- [contactless rheometry](https://finnlight.fi/tag/contactless-rheometry/)
- [soft materials](https://finnlight.fi/tag/soft-materials/)
- [fourier](https://finnlight.fi/tag/fourier/)
- [transform optical spectral analyzer](https://finnlight.fi/tag/transform-optical-spectral-analyzer/)
- [optical lithography](https://finnlight.fi/tag/optical-lithography/)
- [imprint lithography](https://finnlight.fi/tag/imprint-lithography/)
- [wafer adhesive bonding](https://finnlight.fi/tag/wafer-adhesive-bonding/)
- [plasma etcher](https://finnlight.fi/tag/plasma-etcher/)
- [fluorine chemistry](https://finnlight.fi/tag/fluorine-chemistry/)
- [RIE system](https://finnlight.fi/tag/rie-system/)
- [chlorine chemistry](https://finnlight.fi/tag/chlorine-chemistry/)
- [icp-rie](https://finnlight.fi/tag/icp-rie/)
- [thermal annealing](https://finnlight.fi/tag/thermal-annealing/)
- [semiconductor wafers](https://finnlight.fi/tag/semiconductor-wafers/)
- [RTA/RTP](https://finnlight.fi/tag/rta-rtp/)
- [wire bonder](https://finnlight.fi/tag/wire-bonder/)
- [wafer](https://finnlight.fi/tag/wafer/)
- [assembly cell](https://finnlight.fi/tag/assembly-cell/)
- [pull tester](https://finnlight.fi/tag/pull-tester/)
- [bond tester](https://finnlight.fi/tag/bond-tester/)
- [thinning and polishing system](https://finnlight.fi/tag/thinning-and-polishing-system/)
- [SiO2](https://finnlight.fi/tag/sio2/)
- [SiN](https://finnlight.fi/tag/sin/)
- [plasmalab](https://finnlight.fi/tag/plasmalab/)
- [vapor deposition](https://finnlight.fi/tag/vapor-deposition/)
- [plasma treatment](https://finnlight.fi/tag/plasma-treatment/)
- [surface plasma treatment](https://finnlight.fi/tag/surface-plasma-treatment/)
- [semiautomatic](https://finnlight.fi/tag/semiautomatic/)
- [direct writing lithography system](https://finnlight.fi/tag/direct-writing-lithography-system/)
- [reactive plasma etcher](https://finnlight.fi/tag/reactive-plasma-etcher/)
- [diamond saw](https://finnlight.fi/tag/diamond-saw/)
- [wafer dicing](https://finnlight.fi/tag/wafer-dicing/)
- [wafer-level testing](https://finnlight.fi/tag/wafer-level-testing-2/)
- [probe station](https://finnlight.fi/tag/probe-station/)
- [die bonding](https://finnlight.fi/tag/die-bonding/)
- [pick-and-place assembly](https://finnlight.fi/tag/pick-and-place-assembly/)

## Category

- [Design](https://finnlight.fi/services/design/) - We offer a wide range of design capabilities for the design of optical systems, photonic components and light sources, and silicon photonics. We also provide training for optical engineering.
- [Fabrication](https://finnlight.fi/services/fabrication/) - Our capabilities cover a wide range of materials including carbon-based materials, semiconductors, photovoltaic materials, coatings, thin-films, and glasses. We also have a wide range of fabrication methods including epitaxy, lithography, atomic layer deposition, and 3D printing optics.
- [Integration](https://finnlight.fi/services/integration/) - Our partners have expertise and technology for optical waveguides and interconnects, assembly of components and packaging as well as manufacturing of prototypes.
- [Characterization](https://finnlight.fi/services/characterization/) - We offer a wide range of characterization methods for materials, light sources, optical components, surface analysis, high-speed testing, and spectral analysis.
- [Ray and beam optics design](https://finnlight.fi/services/design/ray-and-beam-optics-design/) - Commercial, off-the-shelf, and custom lenses are the basic building blocks of typical free-space optics and optical devices such as binoculars, microscopes, cameras, etc. We offer the design of such systems based on ray tracing. In addition to lenses, the system may include mirrors and paraxial (feature size of the structures is much larger than the wavelength(s) of interest) diffractive surfaces. We also offer illumination design and analysis.
- [Diffractive optics and nanophotonics design](https://finnlight.fi/services/design/diffractive-optics-and-nanophotonics-design/) - Diffractive optics is based on the phenomenon of light diffraction induced by wavelength-scale surface structures. The structures can affect either the phase or amplitude of the incident light or on both. Diffractive optics can be applied in beam splitters, diffractive lenses, beam shaping, etc. Nanophotonics involves the interaction of light with structures with dimensions smaller than the used wavelength. In our case, we divide this into two categories: metamaterials and plasmonic structures. Metamaterials can be used, for example, in polarizers and as a replacement for diffractive optics. Plasmonic structures are typically used in enhancing light fields, e.g., in Raman and fluorescent spectroscopy. We offer rigorous electromagnetic theory-based design services for diffractive optics and nanophotonic components.
- [Waveguide optics design](https://finnlight.fi/services/design/waveguide-optics-design/) - Optical waveguides propagate light along a core where light is confined by a refractive index difference between the core and the cladding material. Waveguides are either single or multi-moded, depending on the number of propagating waveguide modes. Waveguide optics covers fiber optics, waveguides on planar substrates, and photonic integrated circuits (PICs) with their various waveguide components. Please refer to the service cards below for more information and contact details.
- [Multidisciplinary design](https://finnlight.fi/services/design/multidisciplinary-design/) - Photonics itself covers a wide range or applications, technologies and wavelengths. Furthermore, the design of photonic components and systems often requires complementary design for e.g. electronics, mechanics, thermal management, microfluidics or software. Here we list those FinnLight services and tools that support multidisciplinary design.
- [Micro- and Nanopatterning](https://finnlight.fi/services/fabrication/micro-and-nanopatterning/) - Micro- and nanolithography is a key technology in manufacturing of integrated circuits and microchips that allows for creating patterns with a feature size from nanometer up to millimeter scale. Lithography techniques can be divided into two types: masked lithography and maskless lithography. Masked lithography such as photolithography and nanoimprint lithography makes use of masks to transfer patterns over a large area simultaneously making the process cost-effective. Maskless lithography such as electron beam lithography and laser writing enable arbitrary patterns with high-resolution and a minimum feature size as small as a few nanometers.
- [Thin film deposition and epitaxy](https://finnlight.fi/services/fabrication/thin-film-deposition-and-epitaxy/) - Thin film deposition enables the development of advanced technologies by precisely depositing thin layers of materials onto solid surfaces through different techniques. Atomic Layer Deposition (ALD) operates through a sequential, self-limiting reaction mechanism that allows for the controlled growth of thin films with atomic-level accuracy, resulting in conformal and uniform coatings with exceptional control over film composition and thickness. Molecular Beam Epitaxy (MBE) is crystalline thin film deposition method used for the fabrication of semiconductor devices that operates under ultra-high vacuum conditions and involves the evaporation of elemental or molecular species from separate sources allowing for growing atomic layers with well-defined interfaces.
- [Flip-chip and die bonding](https://finnlight.fi/services/integration/flip-chip-and-die-bonding/) - Photonic modules and systems can be realized by integrating together different photonic and electronic chips and by further integrating those with e.g. microfluidic chips or hermetic sealing caps. Here we summarize those services and tools that relate to the hybrid-integration of chip or dies. Integration can be done on top of other chips, on full wafers or even on flexible substrates.
- [Waveguide and fiber alignment](https://finnlight.fi/services/integration/waveguide-and-fiber-alignment/) - Optical waveguides and fibers need to be precisely aligned together during component characterization and before the permanent assembly of fiber-pigtails to photonic waveguide chips. Required alignment accuracy can be from several micrometers to
- [Optical module packaging](https://finnlight.fi/services/integration/optical-module-packaging/) - Module-level packaging of photonics typically involves steps like fiber-pigtailing, precise alignment of other photonic components, integration of control and readout electronics, microfluidics integration, thermal management and/or (hermetic) sealing. Please refer to the service cards below for related services, tools and contact persons.
- [Optical component characterization](https://finnlight.fi/services/characterization/optical-component-characterization/) - Here we list those services and tools that relate to the characterization of optical and photonic components, except for those that exclusively fall under the other characterization service categories (light sources, signal generation, microscopy, surface analysis etc.).
- [Light source characterization](https://finnlight.fi/services/characterization/light-source-characterization/) - Characterizing the properties of light beams is essential to ensure the desired performance, optimize their efficiency, and achieve precise control over applications ranging from scientific research to industrial processes. We can characterize and analyze different parameters including spatial intensity distribution, near-field luminous intensity distributions, polarization, emission spectrum, temporal duration, and chirp.
- [Spectral analysis and imaging](https://finnlight.fi/services/characterization/spectral-analysis-and-imaging/) - We provide reliable and accurate spectral and color measurements of solid and liquid samples. We can measure optical reflectance, transmission, and absorption properties of samples in the ultraviolet, visible, and infrared wavelength ranges. In addition, we can perform spectral fluorescence measurements in the ultraviolet and visible light spectral ranges. We also offer spectral imaging, where each pixel of the image is associated with its color spectrum. These services also include spectral performance characterization of optical components. Please refer to the service cards below for more information and contact details.
- [Optical signal generation and analysis](https://finnlight.fi/services/characterization/optical-signal-generation-and-analysis/) - Optical signal generation involves the creation of light signals with specific properties for various applications. This process typically utilizes devices such as lasers, light-emitting diodes or optical modulators to generate optical signals with precise characteristics such as intensity, wavelength, and modulation format. Optical signal generation is crucial in telecommunications, fiber optic communications, optical sensing, and other fields where the transmission of information or the manipulation of light is required. Optical signal analysis relates tothe detection and measurement of optical signals, allowing for assessing the signals quality, identifying impairments, and ensuring reliable transmission. Techniques such as optical spectrum analysis, power measurements, eye diagram analysis, and polarization analysis are typically used to evaluate characteristics such as power levels, spectral content, modulation depth, bit error rate, and polarization state.
- [Surface and shape analysis](https://finnlight.fi/services/characterization/surface-and-shape-analysis/) - Photonic components come in many shapes and sizes from macroscopic lenses and microscopic waveguides to nanoscale patterns in diffractive optical elements. It is important and sometimes challenging to precisely measure surface roughnesses, linewidths, corner roundings, curvatures and shapes of such components. Here we list those services and tools that relate to the characterization of surfaces and shapes.
- [Material and thin film characterization](https://finnlight.fi/services/characterization/material-and-thin-film-characterization/) - Our comprehensive characterization techniques allows for in-depth analysis and understanding of the properties, structures, and behaviors of various materials and thin films. We have various advanced methods available to analyze the composition, crystallinity, chemical bonding, and optical properties of materials and thin films such as spectroscopy, ellipsometry, X-ray diffraction, and surface analysis.
- [Test automation and data analysis](https://finnlight.fi/services/characterization/test-automation-and-data-analysis/) - Accurate, repeatable and fast characterization of multiple photonic components and systems is not only necessary for industry, but often needed in scientific research as well. It is sometimes also needed to analyze large amounts of test results. Here we describe services and tools that relate to test automation and data analysis.
- [Material processing](https://finnlight.fi/services/fabrication/material-processing/) - We offer different services for the design, synthesis and characterization of glass media for photonic applications.
- [Light sources](https://finnlight.fi/services/characterization/light-sources/)
- [Electron spectroscopy for surface analysis](https://finnlight.fi/services/characterization/electron-spectroscopy-for-surface-analysis/) - Surface science is a branch of physical science that deals with the properties of the surface of a solid, or the interface between any two phases, and phenomena occurring there. We are experts in X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), photoemission electron microscopy (PEEM), and spectromicroscopy that can be utilized to study material composition, chemical bonding, surface structure, and morphology. The NanoESCA spectromicroscope is capable for energy-filtered spectroscopic imaging, chemical mapping, and workfunction mapping down to below micrometer lateral resolution.

## Locations

- [Tampere](https://finnlight.fi/location/tampere/)
- [Oulu](https://finnlight.fi/location/oulu/)
- [Kuopio](https://finnlight.fi/location/kuopio/)
- [Joensuu](https://finnlight.fi/location/joensuu/)
- [Espoo](https://finnlight.fi/location/espoo/)
- [UEF online](https://finnlight.fi/location/uef-online/)